Browse "School of Electrical Engineering(전기및전자공학부)" by Author 544

Showing results 119 to 138 of 138

119
Temperature dependent universal hole and electron mobility models for CMOS circuit simulation

Min, Kyeong-Sik; Lee, Kwyro, Proceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95, pp.210 - 213, 1995-11-06

120
The Dependence of I-V Characteristics in GaAs-AlxGa1-xAs-GaAs heterojunction barriers on the transverse uniaxial stress

Lu, S. S.; Lee, Kwyro; Nathan, M. I.; Heiblum, M.; Wright, S. L., 16th Int. Symposium on GaAs and Related Compounds, v.106, pp.795 - 799, 1989

121
The Impact of nm CMOS Technology on RF Circuit and System

Lee, Kwyro, Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, pp.115 - 118, 2003

122
The Impact of nm CMOS Technology on Wireless Circuit and System

Lee, Kwyro, First Hiroshima International Workshop on Nanoelectronics for Terra-Bit Information Processing, 2003-03

123
The Impact of Semiconductor Technology Scaling on CMOS Radio

Lee, Kwyro, IEEE-Inst Electrical Electronics Engineers Inc, v.35, no.38, IEEE-Inst Electrical Electronics Engineers Inc, 2003

124
Thermal Noise Model for Short-Channel MOSFETs

Han, Kwangseok; Shin, Hyungcheol; Lee, Kwyro, The 10th Korean Conference on Semiconductors, The 10th Korean Conference on Semiconductors, 2003-02

125
Thermal Noise Modeling for Short - Channel MOSFET's

Lee, Kwyro; Shin, Hyung-Cheol; Han, Kwangseok, International Conference on Simulation of Semiconductor Processes and Devices(SISPAD), pp.79 - 82, 2003

126
Thick Metal CMOS Technology on High Resistivity Substrate for Monolithic 900 MHz and 1.9 GHz CMOS LNAs

Kim, C.S.; Park, M.; Kim, C.h; Yu, H.K; Lee, Kwyro; Kim, D.Y; Cho, H., IEEE MTT-S International Microwave Symposium Digest, pp.573 - 576, IEEE, 1999

127
Time Dependent Hot-Carrier-Induced Interface State Generation in Deep Submicron LDD nMOSFETs

이귀로; 김시호, 대한전자공학회 학술대회 , pp.209 - 210, 대한전자공학회, 1995

128
Time-Normalized Feature in Noisy Environment

Yoo, Chang Dong; Lee, Kwyro, International Conference on Speech Processing 99, pp.341 - 344, IEEE, 1999-08

129
True nonvolatile analog memory cell using coupling-charge balancing

Kim, Kyu-hyoun; Lee, Kwyro, Proceedings of the 1996 IEEE International Solid-State Circuits Conference, v.39, pp.268 - 269, 1996-02-08

130
Tunneling nitride insulator grown by electron cyclotron resonance nitrogen plasma nitridation for low-voltage EEPROM

Lee, Kwyro; Min, Kyeong-Sik; Chung, Jin-Yong, The 8th Korean Conference on Semiconductors, pp.15 - 16, 2001

131
Unified CMOS Model for Circuit Simulation

Fjeldly, T. A.; Shur, M.; Ytterdal, M. S.; Lee, Kwyro, Proc. of 1st Int. Device Reseach Symposium, v.35, no.12, pp.407 - 410, Elsevier, 1992

132
Unified I-V Model and Parameter Extraction of Submicron nMOSFET for Circuit Simulaton and Statistical Process Characterization

Lee, Kwyro; Park, C.K.; Moon, B.J.; Shur, M., VLSI Process/Device Modeling Workshop, pp.144 - 145, 1990

133
Unified model for on-chip interconnects

Yu, S.; Sim, S.-P.; Krishnan, S.; Petranovic, D.M.; Lee, Kwyro; Yang, C.Y., 2004 7th International Conference on Solid-State and Integrated Circuits Technology, v.2, pp.1026 - 1031, 2004-10-18

134
Unizxial Stress Dependent I-V Characteristics of GaAs-AlxGa1-xGaAs Single Tunnel Barrier at 77K

Lee, Kwyro; Lu, S.S.; Nathan, M.I.; Heiblum, M.; Wright, S.L., Proc. of 4th Int. Conf. on Modulation Doped Semiconductor Structures, pp.671 - 676, 1989

135
VLSI Neural Network과 Trimming Analog 회로를 위한 고속, 고분해능 CMOS 아날로그 메모리

이귀로; 김규현, 대한전자공학회 학술대회 , pp.139 - 140, 대한전자공학회, 1995

136
X-ray irradiation induced damage in MOS structures and it's effect on oxide reliability

Lee, Kwyro; Han, Chul-Hi; Kim, Shi-Ho; Lee, Ho-Jun; Choi, Sang-Soo; Jeon, Young-Jin; Fabrizio, Enzo Di; et al, Technical Digest of 3rd International Conference on VLSI and CAD, pp.20 - 23, 1993

137
결정방향과 수직전장에 따른 MOS 표면 전자이동도의 변화

최주선; 이귀로, 반도체 재료 및 부품연구회, 씨에이디 연구회 합동 학술발표회, 대한전자공학회, 1989

138
이동통신 시스템을 위한 Digital Data Processor의 설계

이귀로; 권형준; 이석준, 대한전자공학회 학술대회 , pp.163 - 164, 대한전자공학회, 1994

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