Browse "School of Electrical Engineering(전기및전자공학부)" by Subject TEM
Showing results 4 to 4 of 4
| Void nucleation on intentionally added defects in Al interconnects Doan, JC; Lee, Seok-Hee; Bravman, JC; Flinn, PA; Marieb, TN, APPLIED PHYSICS LETTERS, v.75, no.5, pp.633 - 635, 1999-08 |
Discover
Open Access
- 573 OA Article
Date issued
- 4,914 2020 - 2024
- 18,938 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989