Browse "School of Electrical Engineering(전기및전자공학부)" by Subject OXIDE-UNGROWTH PHENOMENON

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Isolation process induced wafer warpage

Jang, SA; Yeo, IS; Kim, YB; Cho, Byung Jin; Lee, SK, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.1, no.1, pp.46 - 48, 1998-07

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