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Observation of Irreversible Current Path in Polymer Dielectric using Conductive Atomic Force Microscope Jung, Ji-Hoon; Kim, Woo Young; Kim, Do-Kyung; Kwon, Jin-Hyuk; Lee, Hee-Chul; Bae, Jin-Hyuk, ELECTRONIC MATERIALS LETTERS, v.11, no.2, pp.246 - 251, 2015-03 |
Reliable thin-film encapsulation of flexible OLEDs and enhancing their bending characteristics through mechanical analysis Han, Yun Cheol; Jeong, Eun Gyo; Kim, Hyuncheol; Kwon, Seonil; Im, Hyeon-Gyun; Bae, Byeong-Soo; Choi, Kyung Cheol, RSC ADVANCES, v.6, no.47, pp.40835 - 40843, 2016-04 |
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