Browse "School of Electrical Engineering(전기및전자공학부)" by Subject INJECTION
Showing results 8 to 21 of 21
| Damage immune field effect transistors with vacuum gate dielectric Han, Jin-Woo; Ahn, Jae-Hyuk; Choi, Yang-Kyu, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.29, no.1, pp.110141 - 110144, 2011-01 |
| Decision Threshold Control Method for the Optical Receiver of a WDM-PON Lee, Hoon-Keun; Moon, Jung-Hyung; Mun, Sil-Gu; Choi, Ki-Man; Lee, Chang-Hee, JOURNAL OF OPTICAL COMMUNICATIONS AND NETWORKING, v.2, no.6, pp.381 - 388, 2010-06 |
| Electron-beam irradiation-induced gate oxide degradation Cho, Byung Jin; Chong, PF; Chor, EF; Joo, MS; Yeo, IS, JOURNAL OF APPLIED PHYSICS, v.88, no.11, pp.6731 - 6735, 2000-12 |
| Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFETs with recessed LOCOS isolation structure Yue, JMP; Chim, WK; Cho, Byung Jin; Chan, DSH; Qin, WH; Kim, YB; Jang, SA; et al, IEEE ELECTRON DEVICE LETTERS, v.21, no.3, pp.130 - 132, 2000-03 |
| Integrated Bias Circuits of RF CMOS Cascode Power Amplifier for Linearity Enhancement Koo, Bon-Hoon; Na, Yoo-Sam; Hong, Song-Cheol, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.60, no.2, pp.340 - 351, 2012-02 |
| Modeling of Seeded Reflective Modulators for DWDM Systems Kim, Joon-Young; Moon, Sang-Rok; Yoo, Sang-Hwa; Lee, Chang-Hee, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, v.19, no.5, 2013-09 |
| Modeling the electrical characteristics of TIPS-pentacene thin-film transistors: Effect of contact barrier, field-dependent mobility, and traps Gupta, Dipti; Jeon, Namho; Yoo, Seunghyup, ORGANIC ELECTRONICS, v.9, no.6, pp.1026 - 1031, 2008-12 |
| Origin of temperature-sensitive hole current at low gate voltage regime in ultrathin gate oxide Ang, CH; Ling, CH; Cheng, ZY; Cho, Byung Jin, JOURNAL OF APPLIED PHYSICS, v.88, no.5, pp.2872 - 2876, 2000-09 |
| Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides Ang, CH; Ling, CH; Cho, Byung Jin; Kim, SJ; Cheng, ZY, SOLID-STATE ELECTRONICS, v.44, no.11, pp.2001 - 2007, 2000-11 |
| Role of hole fluence in gate oxide breakdown Li, MF; He, YD; Ma, SG; Cho, Byung Jin; Lo, KF; Xu, MZ, IEEE ELECTRON DEVICE LETTERS, v.20, no.11, pp.586 - 588, 1999-11 |
| Time dependent hot-carrier induced interface state generation in deep submicron LDD nMOSFETs Kim, SH; Min, KS; Lee, Kwyro, SOLID-STATE ELECTRONICS, v.39, no.3, pp.405 - 410, 1996-03 |
| Toward High-Output Organic Vertical Field Effect Transistors: Key Design Parameters Kwon, Hyukyun; Kim, Min-Cheol; Cho, Hyunsu; Moon, Hanul; Lee, Jongjin; Yoo, Seunghyup, ADVANCED FUNCTIONAL MATERIALS, v.26, no.38, pp.6888 - 6895, 2016-10 |
| Tuning the electrode work function via a vapor-phase deposited ultrathin polymer film Baek, Jieung; Lee, Junseok; Joo, Munkyu; Han, Donggeon; Kim, Houngkyung; Seong, Hyejeong; Lee, Jinsup; et al, JOURNAL OF MATERIALS CHEMISTRY C, v.4, no.4, pp.831 - 839, 2016-01 |
Tuning-free controller to accurately regulate flow rates in a microfluidic network Heo, Young Jin; Kang, Junsu; Kim, Min Jun; Chung, Wan Kyun, SCIENTIFIC REPORTS, v.6, pp.23273, 2016-03 |
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