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Band bending effect induced by gate voltage on the charge loss behavior of charge trap flash memory devices Chang, M.; Hwang, H.; Jeon, Sanghun., APPLIED PHYSICS LETTERS, v.96, no.5, 2010-02 |
Efficient color feature extraction and matching for motion estimation and mapping Hwang, H.; Kweon, In-So, IEEE/RSJ International Conference on Intelligent Robots and Systems, 2008, 2008-09-22 |
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