DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Yong-Jae | ko |
dc.contributor.author | Yun, Tae Gwang | ko |
dc.contributor.author | Choi, In-Chul | ko |
dc.contributor.author | Kim, Sungwoong | ko |
dc.contributor.author | Park, WI | ko |
dc.contributor.author | Han, Seung Min J. | ko |
dc.contributor.author | Jang, Jae-il | ko |
dc.date.accessioned | 2015-06-29T04:51:28Z | - |
dc.date.available | 2015-06-29T04:51:28Z | - |
dc.date.created | 2015-06-23 | - |
dc.date.created | 2015-06-23 | - |
dc.date.issued | 2015-05 | - |
dc.identifier.citation | SCIENTIFIC REPORTS, v.5 | - |
dc.identifier.issn | 2045-2322 | - |
dc.identifier.uri | http://hdl.handle.net/10203/199519 | - |
dc.description.abstract | Nanoscale time-dependent mechanical-electrical coupled behavior of single crystal ZnO nanorods was systematically explored, which is essential for accessing the long-term reliability of the ZnO nanorod-based flexible devices. A series of compression creep tests combined with in-situ electrical measurement was performed on vertically-grown single crystal ZnO nanorods. Continuous measurement of the current (I)-voltage (V) curves before, during, after the creep tests revealed that I is non-negligibly increased as a result of the time-dependent deformation. Analysis of the I-V curves based on the thermionic emission-diffusion theory allowed extraction of nanorod resistance, which was shown to decrease as time-dependent deformation. Finally, based on the observations in this study, a simple analytical model for predicting the reduction in nanorod resistance as a function of creep strain that is induced from diffusional mechanisms is proposed, and this model was demonstrated to be in an excellent agreement with the experimental results. | - |
dc.language | English | - |
dc.publisher | NATURE PUBLISHING GROUP | - |
dc.subject | CURRENT-VOLTAGE CHARACTERISTICS | - |
dc.subject | SILICON NANOWIRES | - |
dc.subject | STRAIN SENSOR | - |
dc.subject | ZINC-OXIDE | - |
dc.subject | CREEP | - |
dc.subject | NANOINDENTATION | - |
dc.subject | PLASTICITY | - |
dc.subject | CONTACTS | - |
dc.title | Time-dependent mechanical-electrical coupled behavior in single crystal ZnO nanorods | - |
dc.type | Article | - |
dc.identifier.wosid | 000355266900001 | - |
dc.identifier.scopusid | 2-s2.0-84929629870 | - |
dc.type.rims | ART | - |
dc.citation.volume | 5 | - |
dc.citation.publicationname | SCIENTIFIC REPORTS | - |
dc.identifier.doi | 10.1038/srep09716 | - |
dc.contributor.localauthor | Han, Seung Min J. | - |
dc.contributor.nonIdAuthor | Kim, Yong-Jae | - |
dc.contributor.nonIdAuthor | Yun, Tae Gwang | - |
dc.contributor.nonIdAuthor | Choi, In-Chul | - |
dc.contributor.nonIdAuthor | Kim, Sungwoong | - |
dc.contributor.nonIdAuthor | Park, WI | - |
dc.contributor.nonIdAuthor | Jang, Jae-il | - |
dc.description.isOpenAccess | Y | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | CURRENT-VOLTAGE CHARACTERISTICS | - |
dc.subject.keywordPlus | SILICON NANOWIRES | - |
dc.subject.keywordPlus | STRAIN SENSOR | - |
dc.subject.keywordPlus | ZINC-OXIDE | - |
dc.subject.keywordPlus | CREEP | - |
dc.subject.keywordPlus | NANOINDENTATION | - |
dc.subject.keywordPlus | PLASTICITY | - |
dc.subject.keywordPlus | CONTACTS | - |
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