DC Field | Value | Language |
---|---|---|
dc.contributor.author | Noh, ES | - |
dc.contributor.author | Lee, Hyuck Mo | - |
dc.date.accessioned | 2007-11-16T05:40:36Z | - |
dc.date.available | 2007-11-16T05:40:36Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-01 | - |
dc.identifier.citation | Materials Science Forum, v.475-479, no., pp.1 - 5 | - |
dc.identifier.issn | 0255-5476 | - |
dc.identifier.uri | http://hdl.handle.net/10203/1964 | - |
dc.language | ENG | - |
dc.language.iso | en_US | en |
dc.publisher | TRANS TECH PUBLICATIONS LTD | - |
dc.title | Exchange-bias of NiFe/NiO bilayer | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.volume | 475-479 | - |
dc.citation.beginningpage | 1 | - |
dc.citation.endingpage | 5 | - |
dc.citation.publicationname | Materials Science Forum | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Lee, Hyuck Mo | - |
dc.contributor.nonIdAuthor | Noh, ES | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.