Aggressive Voltage Scaling Through Fast Correction of Multiple Errors With Seamless Pipeline Operation

Cited 7 time in webofscience Cited 8 time in scopus
  • Hit : 576
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorShin, In-Supko
dc.contributor.authorKim, Jae-Joonko
dc.contributor.authorShin, Youngsooko
dc.date.accessioned2015-04-08T04:58:35Z-
dc.date.available2015-04-08T04:58:35Z-
dc.date.created2014-11-26-
dc.date.created2014-11-26-
dc.date.issued2015-02-
dc.identifier.citationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.62, no.2, pp.468 - 477-
dc.identifier.issn1549-8328-
dc.identifier.urihttp://hdl.handle.net/10203/195610-
dc.description.abstractAggressive reduction of timing margins, called timing speculation, is an effective way of reducing the supply voltage for a pipeline circuit and thereby its power consumption. However, probability of timing error increases with the voltage scaling and hence, the errors must be corrected with small cycle penalty. We introduce an improved Razor flip-flop which makes more effective use of its shadow latch, so that a pipeline stage can correct an error while continuing to receive data. This avoids the need for repeated clock gating when timing errors happen simultaneously at different stages, or when an error persists. The new flip-flop also facilitates time-borrowing. Our technique uses less energy than the state-of-the art technique, and the energy saving increases with pipeline length: with 10 stages, 4-9% smaller energy is used.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectDYNAMIC VARIATION TOLERANCE-
dc.subjectCIRCUITS-
dc.titleAggressive Voltage Scaling Through Fast Correction of Multiple Errors With Seamless Pipeline Operation-
dc.typeArticle-
dc.identifier.wosid000349399800015-
dc.identifier.scopusid2-s2.0-84922333356-
dc.type.rimsART-
dc.citation.volume62-
dc.citation.issue2-
dc.citation.beginningpage468-
dc.citation.endingpage477-
dc.citation.publicationnameIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS-
dc.identifier.doi10.1109/TCSI.2014.2364691-
dc.contributor.localauthorShin, Youngsoo-
dc.contributor.nonIdAuthorKim, Jae-Joon-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorError correction-
dc.subject.keywordAuthorlow voltage operation-
dc.subject.keywordAuthortiming speculation-
dc.subject.keywordPlusDYNAMIC VARIATION TOLERANCE-
dc.subject.keywordPlusCIRCUITS-
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 7 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0