DC Field | Value | Language |
---|---|---|
dc.contributor.author | Oh, Young-Jun | ko |
dc.contributor.author | HAN, WOOHYUN | ko |
dc.contributor.author | Noh, Hyeon-Kyun | ko |
dc.contributor.author | Chang, Kee-Joo | ko |
dc.date.accessioned | 2015-03-27T05:45:26Z | - |
dc.date.available | 2015-03-27T05:45:26Z | - |
dc.date.created | 2015-01-06 | - |
dc.date.issued | 2014-08 | - |
dc.identifier.citation | 32nd International Conference on the Physics of Semiconductors | - |
dc.identifier.uri | http://hdl.handle.net/10203/194296 | - |
dc.language | English | - |
dc.publisher | ICPS | - |
dc.title | Role of Oxygen-Related Defects in the Instability of Amorphous In-Ga-Zn-O Thin FlimTransistor | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 32nd International Conference on the Physics of Semiconductors | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Austin Convention Center, Austin, TX | - |
dc.contributor.localauthor | Chang, Kee-Joo | - |
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