Detecting defects with thermoelectricity at the atomic scale
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Eui-Sup | ko |
| dc.contributor.author | Kim, Yong-Hyun | ko |
| dc.contributor.author | Yeo, Hogi | ko |
| dc.contributor.author | Cho, Sanghee | ko |
| dc.date.accessioned | 2014-12-09 | - |
| dc.date.available | 2014-12-09 | - |
| dc.date.created | 2014-11-07 | - |
| dc.date.issued | 2014-08-12 | - |
| dc.identifier.citation | International Conference on Physics and Semiconductors (ICPS 2014) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/192041 | - |
| dc.language | English | - |
| dc.publisher | The University of TEXAS at Austin | - |
| dc.title | Detecting defects with thermoelectricity at the atomic scale | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Conference on Physics and Semiconductors (ICPS 2014) | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Austin Convention Center, Austin, TX | - |
| dc.contributor.localauthor | Kim, Yong-Hyun | - |
| dc.contributor.nonIdAuthor | Lee, Eui-Sup | - |
| dc.contributor.nonIdAuthor | Yeo, Hogi | - |
| dc.contributor.nonIdAuthor | Cho, Sanghee | - |
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