Simulation of Scanning Seebeck Microscopy Images
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Yong-Hyun | ko |
| dc.date.accessioned | 2014-12-09 | - |
| dc.date.available | 2014-12-09 | - |
| dc.date.created | 2014-11-07 | - |
| dc.date.issued | 2014-11-18 | - |
| dc.identifier.citation | International Conference on Electronic Materials and Nanotechnology for Green Environment | - |
| dc.identifier.uri | http://hdl.handle.net/10203/192007 | - |
| dc.language | English | - |
| dc.publisher | The Korean Institute of Metals and Materials | - |
| dc.title | Simulation of Scanning Seebeck Microscopy Images | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Conference on Electronic Materials and Nanotechnology for Green Environment | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Ramada Plaza Jeju Hotel | - |
| dc.contributor.localauthor | Kim, Yong-Hyun | - |
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