Showing results 12 to 20 of 20
PCB 비파괴 검사에 있어서 단일 에너지 소스와 이중 에너지 소스의 영상비교를 위한 엑스선 스펙트럼 분석 Cho, Gyuseong; Kim, Myung Soo; Kim, Giyoon; Lee, Minju; Kang, Dong Uk; Lee, Daehee; PARK, KYEONGJIN; et al, 한국방사선산업학회지, v.9, no.3, pp.153 - 159, 2015-09 |
Photodiode area effect on performance of X-ray CMOS active pixel sensors Kim, Myung Soo; Kim, Y.; Kim, G.; Lim, Kyung Taek; Cho, Gyuseong; Kim, Dongeun, JOURNAL OF INSTRUMENTATION, v.13, no.2, 2018-02 |
Photodiode area effect on the X-ray CMOS APS’s performance Kim, Myung Soo; Kim, Yewon; Kim, Giyoon; Lim, Kyung Taek; Cho, Gyuseong, 2017 iWoRiD, International Workshop on Radiation Imaging Detectors, 2017-07-05 |
Photon crosstalk in pixel array for X-ray imaging Kim, Myung Soo; Kim, Giyoon; Kang, Dong Uk; Lee, Daehee; Cho, Gyuseong, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVI, SPIE, 2014-08 |
Photon-number resolving capability in SiPMs with electric field variation for radiation detection applications Lim, Kyung Taek; Kim, Hyoungtaek; Kim, Myung Soo; Kim, Yewon; Lee, Chang-yeop; Cho, Gyuseong, RADIATION PHYSICS AND CHEMISTRY, v.155, pp.101 - 106, 2019-02 |
REPLACEMENT OF A PHOTOMULTIPLIER TUBE IN A 2-INCH THALLIUM-DOPED SODIUM IODIDE GAMMA SPECTROMETER WITH SILICON PHOTOMULTIPLIERS AND A LIGHT GUIDE Kim, Chankyu; Kim, Hyoungtaek; Kim, Jongyul; Lee, Chaehun; Yoo, Hyunjun; Kang, Dong Uk; Cho, Minsik; et al, NUCLEAR ENGINEERING AND TECHNOLOGY, v.47, no.4, pp.479 - 487, 2015-06 |
Study on SiPM Performance with Electric-field Variation in Radiation Detection Applications Lim, Kyung Taek; Kim, Hyean Dock; Kim, Myung Soo; Kim, Yewon; Cho, Gyuseong, Industrial Radiation and Radioisotope Measurement Applications, Industrial Radiation and Radioisotope Measurement Applications, 2017-07-10 |
방사선 노출에 따른 3T APS 성능 감소와 몬테카를로 시뮬레이션을 통한 픽셀 내부 결함의 비교분석 Cho, Gyuseong; Kim, Giyoon; Kim, Myung Soo; Lim, Kyung Taek; LEE, EUNJOONG; Kim, Chankyu; Park, Jonghwan, 한국방사선산업학회지, v.9, no.1, pp.1 - 7, 2015-03 |
전자부품의 자동화된 검사를 위한 엑스선 영상 센서에 대한 연구 = (A) Study on X-ray Image Sensor for Automated Inspection of Electronic Componentslink 김명수; Kim, Myung Soo; et al, 한국과학기술원, 2017 |
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