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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Journal Papers(저널논문)

Performance comparison of wet-etched and dry-etched Geiger-mode avalanche photodiodes using a single diffusion process

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dc.contributor.authorLee, Ki Wonko
dc.contributor.authorYang, Kyounghoonko
dc.date.accessioned2014-09-01T08:25:29Z-
dc.date.available2014-09-01T08:25:29Z-
dc.date.created2014-07-10-
dc.date.created2014-07-10-
dc.date.created2014-07-10-
dc.date.issued2013-11-
dc.identifier.citationPHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, v.10, no.11, pp.1445 - 1447-
dc.identifier.issn1862-6300-
dc.identifier.urihttp://hdl.handle.net/10203/189492-
dc.description.abstractIn this paper, we compare the performances of wet-etched and dry-etched Geiger-mode avalanche photodiodes (GM-APDs) using a single diffusion process at a wavelength of 1.55-μm. The single-diffused GM-APD based on a wet recess-etching has demonstrated the good performances of a dark count rate of 0.03 kHz/μm and a photon detection efficiency of 17.1% at 240 K.-
dc.languageEnglish-
dc.publisherWILEY-V C H VERLAG GMBH-
dc.titlePerformance comparison of wet-etched and dry-etched Geiger-mode avalanche photodiodes using a single diffusion process-
dc.typeArticle-
dc.identifier.scopusid2-s2.0-84887625923-
dc.type.rimsART-
dc.citation.volume10-
dc.citation.issue11-
dc.citation.beginningpage1445-
dc.citation.endingpage1447-
dc.citation.publicationnamePHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS-
dc.identifier.doi10.1002/pssc.201300178-
dc.contributor.localauthorYang, Kyounghoon-
dc.description.isOpenAccessN-
dc.subject.keywordAuthoravalanche photodiode-
dc.subject.keywordAuthordark count rate-
dc.subject.keywordAuthorGeiger-mode avalanche photodiode-
dc.subject.keywordAuthorsingle photon detection-
dc.subject.keywordPlusN-INP-
dc.subject.keywordPlusPLASMA-
dc.subject.keywordPlusDAMAGE-
dc.subject.keywordPlusTRAPS-
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EE-Journal Papers(저널논문)
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