Thermal sintering of solution-deposited nanoparticle silver ink films characterized by spectroscopic ellipsometry

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Low-temperature sintering of metal nanoparticle inks is a promising technique in realizing large area and flexible electronics. It is demonstrated in this letter that spectroscopic ellipsometry in the spectral region of 0.75-3.5 eV can be employed to characterize the sintering process manifested by the evolution of film thickness, effective dielectric function, and percolation transition. A two-oscillator model can be used to model the effective dielectric function. The oscillator energy shifts lower and correlates well with the increase in dc conductance as demonstrated by both in situ and ex situ ellipsometric measurements. A simple model based on two-dimensional R-L-C impedance network was adopted to explain experimental results quantitatively.
Publisher
AMER INST PHYSICS
Issue Date
2008-12
Language
English
Article Type
Article
Keywords

FABRICATION; COMPOSITES

Citation

APPLIED PHYSICS LETTERS, v.93, no.23

ISSN
0003-6951
DOI
10.1063/1.3043583
URI
http://hdl.handle.net/10203/18920
Appears in Collection
ME-Journal Papers(저널논문)
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