Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

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dc.contributor.authorSuga, Mitsuoko
dc.contributor.authorAsahina, Shunsukeko
dc.contributor.authorSakuda, Yusukeko
dc.contributor.authorKazumori, Hiroyoshiko
dc.contributor.authorNishiyama, Hidetoshiko
dc.contributor.authorNokuo, Takeshiko
dc.contributor.authorAlfredsson, Vivekako
dc.contributor.authorKjellman, Tomasko
dc.contributor.authorStevens, Sam M.ko
dc.contributor.authorCho, Hae Sungko
dc.contributor.authorCho, Minhyungko
dc.contributor.authorHan, Luko
dc.contributor.authorChe, Shunaiko
dc.contributor.authorAnderson, Michael W.ko
dc.contributor.authorSchueth, Ferdiko
dc.contributor.authorDeng, Hexiangko
dc.contributor.authorYaghi, Omar M.ko
dc.contributor.authorLiu, Zhengko
dc.contributor.authorJeong, Hu Youngko
dc.contributor.authorStein, Andreasko
dc.contributor.authorSakamoto, Kazuyukiko
dc.contributor.authorRyoo, Ryongko
dc.contributor.authorTerasaki, Osamuko
dc.date.accessioned2014-08-29T02:50:15Z-
dc.date.available2014-08-29T02:50:15Z-
dc.date.created2014-06-10-
dc.date.created2014-06-10-
dc.date.issued2014-05-
dc.identifier.citationPROGRESS IN SOLID STATE CHEMISTRY, v.42, no.1-2, pp.1 - 21-
dc.identifier.issn0079-6786-
dc.identifier.urihttp://hdl.handle.net/10203/189020-
dc.description.abstractResearch concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility. of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of reflections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron microscopy (HRSEM) have therefore become imperative for the above challenges. Here, we present the theory and practical application of recent advances such as through-the-lens detection systems, which permit a reduced landing energy and the selection of high-resolution, topographically specific emitted electrons, even from electrically insulating nano-materials.-
dc.languageEnglish-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.subjectSILICON DRIFT DETECTORS-
dc.subjectMONTE-CARLO-SIMULATION-
dc.subjectLOW-ENERGY ELECTRONS-
dc.subjectX-RAY SPECTROSCOPY-
dc.subjectENVIRONMENTAL CELL-
dc.subjectABERRATION CORRECTION-
dc.subjectDISLOCATION-STRUCTURE-
dc.subjectRESOLUTION LIMITS-
dc.subjectOBJECTIVE LENSES-
dc.subjectROOM-TEMPERATURE-
dc.titleRecent progress in scanning electron microscopy for the characterization of fine structural details of nano materials-
dc.typeArticle-
dc.identifier.wosid000335705400001-
dc.identifier.scopusid2-s2.0-84898043548-
dc.type.rimsART-
dc.citation.volume42-
dc.citation.issue1-2-
dc.citation.beginningpage1-
dc.citation.endingpage21-
dc.citation.publicationnamePROGRESS IN SOLID STATE CHEMISTRY-
dc.identifier.doi10.1016/j.progsolidstchem.2014.02.001-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorRyoo, Ryong-
dc.contributor.nonIdAuthorSuga, Mitsuo-
dc.contributor.nonIdAuthorAsahina, Shunsuke-
dc.contributor.nonIdAuthorSakuda, Yusuke-
dc.contributor.nonIdAuthorKazumori, Hiroyoshi-
dc.contributor.nonIdAuthorNishiyama, Hidetoshi-
dc.contributor.nonIdAuthorNokuo, Takeshi-
dc.contributor.nonIdAuthorAlfredsson, Viveka-
dc.contributor.nonIdAuthorKjellman, Tomas-
dc.contributor.nonIdAuthorStevens, Sam M.-
dc.contributor.nonIdAuthorHan, Lu-
dc.contributor.nonIdAuthorChe, Shunai-
dc.contributor.nonIdAuthorAnderson, Michael W.-
dc.contributor.nonIdAuthorSchueth, Ferdi-
dc.contributor.nonIdAuthorDeng, Hexiang-
dc.contributor.nonIdAuthorYaghi, Omar M.-
dc.contributor.nonIdAuthorLiu, Zheng-
dc.contributor.nonIdAuthorJeong, Hu Young-
dc.contributor.nonIdAuthorStein, Andreas-
dc.contributor.nonIdAuthorSakamoto, Kazuyuki-
dc.type.journalArticleReview-
dc.subject.keywordAuthorScanning electron microscopy-
dc.subject.keywordAuthorThrough-the-lens detection system-
dc.subject.keywordAuthorNano-materials-
dc.subject.keywordAuthorAtmospheric SEM-
dc.subject.keywordAuthorMetal-organic frameworks-
dc.subject.keywordAuthorMesoporous materials-
dc.subject.keywordPlusSILICON DRIFT DETECTORS-
dc.subject.keywordPlusMONTE-CARLO-SIMULATION-
dc.subject.keywordPlusLOW-ENERGY ELECTRONS-
dc.subject.keywordPlusX-RAY SPECTROSCOPY-
dc.subject.keywordPlusENVIRONMENTAL CELL-
dc.subject.keywordPlusABERRATION CORRECTION-
dc.subject.keywordPlusDISLOCATION-STRUCTURE-
dc.subject.keywordPlusRESOLUTION LIMITS-
dc.subject.keywordPlusOBJECTIVE LENSES-
dc.subject.keywordPlusROOM-TEMPERATURE-
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