DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shin, Seung Wook | ko |
dc.contributor.author | Agawane, G. L. | ko |
dc.contributor.author | Kim, In Young | ko |
dc.contributor.author | Jo, Seung Hyun | ko |
dc.contributor.author | Kim, Min Sung | ko |
dc.contributor.author | Heo, Gi-Seok | ko |
dc.contributor.author | Kim, Jin Hyeok | ko |
dc.contributor.author | Lee, JeongYong | ko |
dc.date.accessioned | 2014-08-29 | - |
dc.date.available | 2014-08-29 | - |
dc.date.created | 2014-01-02 | - |
dc.date.created | 2014-01-02 | - |
dc.date.issued | 2013-09 | - |
dc.identifier.citation | SURFACE & COATINGS TECHNOLOGY, v.231, pp.364 - 369 | - |
dc.identifier.issn | 0257-8972 | - |
dc.identifier.uri | http://hdl.handle.net/10203/188625 | - |
dc.description.abstract | Transparent conductive Mg and Ga co-doped ZnO (MGZO) thin films were prepared on glass substrates by RF magnetron sputtering technique. The effect of Mg concentration from 0 to 15 at% on the structural, chemical, morphological, optical and electrical properties of MGZO thin films was investigated. X-ray diffraction studies showed that the pure ZnO, Mg-doped ZnO (MZO) and MGZO thin films were grown as a polycrystalline hexagonal wurtzite phase without secondary phase. The 20 angle position of the (0002) peak of the MZO and MGZO thin films was shifted towards a higher angle with increasing Mg concentration. A typical survey XPS spectrum of the MGZO thin films confirmed the presence of Mg, Ga, Zn and O in the MGZO films. The MGZO thin films had a smoother surface morphology than those of ZnO and MZO. The MGZO thin film deposited at Mg concentration of 5 at% showed the widest optical band gap energy of 3.75 eV and the lowest electrical resistivity of 6.89 x 10(-4) Omega cm. However, the electrical and optical characteristics of the MGZO thin films deposited over 5 at%. Mg concentration were deteriorated with increasing Mg concentration. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | ELECTRICAL-PROPERTIES | - |
dc.subject | OPTICAL-PROPERTIES | - |
dc.subject | SOLAR-CELLS | - |
dc.subject | GROWTH | - |
dc.subject | LAYERS | - |
dc.subject | TEMPERATURE | - |
dc.subject | DEPOSITION | - |
dc.subject | EPITAXY | - |
dc.title | Development of transparent conductive Mg and Ga co-doped ZnO thin films: Effect of Mg concentration | - |
dc.type | Article | - |
dc.identifier.wosid | 000328094200077 | - |
dc.identifier.scopusid | 2-s2.0-84882910234 | - |
dc.type.rims | ART | - |
dc.citation.volume | 231 | - |
dc.citation.beginningpage | 364 | - |
dc.citation.endingpage | 369 | - |
dc.citation.publicationname | SURFACE & COATINGS TECHNOLOGY | - |
dc.identifier.doi | 10.1016/j.surfcoat.2012.03.008 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Lee, JeongYong | - |
dc.contributor.nonIdAuthor | Shin, Seung Wook | - |
dc.contributor.nonIdAuthor | Agawane, G. L. | - |
dc.contributor.nonIdAuthor | Kim, In Young | - |
dc.contributor.nonIdAuthor | Jo, Seung Hyun | - |
dc.contributor.nonIdAuthor | Kim, Min Sung | - |
dc.contributor.nonIdAuthor | Heo, Gi-Seok | - |
dc.contributor.nonIdAuthor | Kim, Jin Hyeok | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Transparent conducting oxide (TCO) | - |
dc.subject.keywordAuthor | Mg and Ga co-doped ZnO (MGZO) | - |
dc.subject.keywordAuthor | Thin films | - |
dc.subject.keywordAuthor | Band gap engineering | - |
dc.subject.keywordAuthor | RF magnetron sputtering | - |
dc.subject.keywordPlus | ELECTRICAL-PROPERTIES | - |
dc.subject.keywordPlus | OPTICAL-PROPERTIES | - |
dc.subject.keywordPlus | SOLAR-CELLS | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordPlus | LAYERS | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | DEPOSITION | - |
dc.subject.keywordPlus | EPITAXY | - |
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