Highly Reliable M1X MLC NAND Flash Memory Cell with Novel Active Air-Gap and p+Poly Process Integration Technologies
- Publisher
- IEEE
- Issue Date
- 2013-12-09
- Language
- ENG
- Citation
IEEE International Electron Devices Meeting
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- 79729.pdf(528.92 kB)Download
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