In situ scanning transmission X-ray microscopy study on bipolar resistive switching mechanism of Al/GO/Al RRAM device
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jong Yun Kim | ko |
| dc.contributor.author | Hyun Woo Nho | ko |
| dc.contributor.author | Jian Wang | ko |
| dc.contributor.author | Hyun-Joon Shin | ko |
| dc.contributor.author | Choi, Sung-Yool | ko |
| dc.contributor.author | Tae Hyun Yoon | ko |
| dc.date.accessioned | 2014-08-28 | - |
| dc.date.available | 2014-08-28 | - |
| dc.date.created | 2013-11-06 | - |
| dc.date.created | 2013-11-06 | - |
| dc.date.issued | 2013-08-26 | - |
| dc.identifier.citation | BAMN 2013 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/187502 | - |
| dc.language | English | - |
| dc.publisher | BAMN 2013 | - |
| dc.title | In situ scanning transmission X-ray microscopy study on bipolar resistive switching mechanism of Al/GO/Al RRAM device | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | BAMN 2013 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | 제주(그랜드호텔) | - |
| dc.contributor.localauthor | Choi, Sung-Yool | - |
| dc.contributor.nonIdAuthor | Jong Yun Kim | - |
| dc.contributor.nonIdAuthor | Hyun Woo Nho | - |
| dc.contributor.nonIdAuthor | Jian Wang | - |
| dc.contributor.nonIdAuthor | Hyun-Joon Shin | - |
| dc.contributor.nonIdAuthor | Tae Hyun Yoon | - |
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