DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kam, Dong Gun | ko |
dc.contributor.author | Kim, Joungho | ko |
dc.date.accessioned | 2010-05-31T08:59:14Z | - |
dc.date.available | 2010-05-31T08:59:14Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-09 | - |
dc.identifier.citation | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.17, no.9, pp.694 - 696 | - |
dc.identifier.issn | 1531-1309 | - |
dc.identifier.uri | http://hdl.handle.net/10203/18683 | - |
dc.description.abstract | A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N-2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. | - |
dc.description.sponsorship | IEEE Microwave Theory and Techniques Society | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | SCATTERING PARAMETERS | - |
dc.title | Multiport measurement method using a two-port network analyzer with remaining ports unterminated | - |
dc.type | Article | - |
dc.identifier.wosid | 000249211300024 | - |
dc.identifier.scopusid | 2-s2.0-34548231664 | - |
dc.type.rims | ART | - |
dc.citation.volume | 17 | - |
dc.citation.issue | 9 | - |
dc.citation.beginningpage | 694 | - |
dc.citation.endingpage | 696 | - |
dc.citation.publicationname | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | - |
dc.identifier.doi | 10.1109/LMWC.2007.903467 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Kam, Dong Gun | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | connector and cable | - |
dc.subject.keywordAuthor | multiport network | - |
dc.subject.keywordAuthor | port renormalization | - |
dc.subject.keywordAuthor | S-parameter measurement | - |
dc.subject.keywordPlus | SCATTERING PARAMETERS | - |
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