CMOS readout circuit allowing microbolometer arrays to operate without temperature stabilisation
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kang, SG | ko |
| dc.contributor.author | Lee, YS | ko |
| dc.contributor.author | Lee, Hee Chul | ko |
| dc.date.accessioned | 2010-05-18T01:28:00Z | - |
| dc.date.available | 2010-05-18T01:28:00Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2004-11 | - |
| dc.identifier.citation | ELECTRONICS LETTERS, v.40, pp.1459 - 1460 | - |
| dc.identifier.issn | 0013-5194 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/18401 | - |
| dc.description.abstract | A new CMOS readout circuit that controls the non-uniformity of microbolometer arrays as a function of operating temperature change is described. This circuit provides a nonlinear bias current for operating temperature using a MOS transistor that is operated in the subthreshold region. This approach allows microbolometer arrays to operate without temperature stabilisation up to an operating temperature change of approximately 40K. | - |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | INST ENGINEERING TECHNOLOGY-IET | - |
| dc.title | CMOS readout circuit allowing microbolometer arrays to operate without temperature stabilisation | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000225461200001 | - |
| dc.identifier.scopusid | 2-s2.0-9144245020 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 40 | - |
| dc.citation.beginningpage | 1459 | - |
| dc.citation.endingpage | 1460 | - |
| dc.citation.publicationname | ELECTRONICS LETTERS | - |
| dc.identifier.doi | 10.1049/el:20046830 | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Lee, Hee Chul | - |
| dc.contributor.nonIdAuthor | Kang, SG | - |
| dc.contributor.nonIdAuthor | Lee, YS | - |
| dc.type.journalArticle | Article | - |
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