Structure analysis of ferroelectric Bi4Ti3O12 by using X-ray powder diffraction

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dc.contributor.authorJeon, MKko
dc.contributor.authorWoo, Seong-Ihlko
dc.contributor.authorKim, YIko
dc.contributor.authorNahm, SHko
dc.date.accessioned2010-05-11T01:46:16Z-
dc.date.available2010-05-11T01:46:16Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2004-11-
dc.identifier.citationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, no.5, pp.1240 - 1243-
dc.identifier.issn0374-4884-
dc.identifier.urihttp://hdl.handle.net/10203/18185-
dc.description.abstractThe structure analysis of Bi4Ti3O12 was performed by using X-ray powder diffraction data to determine a suitable structure system. Two kinds of structural models, monoclinic (M-model) and orthorhombic (O-model), were assumed, and Rietveld refinement was carried out. The weighted and profile R-factors, R-wp and R-p, obtained from the refinement results based on the O-model were 19.54 and 14.84, respectively. On the basis of the M-model, both of the R.-factors, R-wp and Rp, decreased to 14.82 and 10.74, respectively. The goodness-of-fit indicator, S (= R-wp/R.(e)), also decreased from 1.43 to 1.09. The final lattice parameters calculated from the refinement results were a = 5.4496(l) Angstrom, b = 5.4105(l) Angstrom, and c = 32.8136(9) Angstrom. The beta angle was 89.96(3)degrees.-
dc.description.sponsorshipThis work was partially supported by the Center for Ultramicrochemical Process Systems (CUPS) sponsored by KOSEF (2004) and the Centre for Nanoscale Mechatronics and Manufacturing.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherKOREAN PHYSICAL SOC-
dc.subjectBISMUTH TITANATE-
dc.subjectTHIN-FILMS-
dc.subjectTEMPERATURE-
dc.subjectMEMORIES-
dc.titleStructure analysis of ferroelectric Bi4Ti3O12 by using X-ray powder diffraction-
dc.typeArticle-
dc.identifier.wosid000225146300010-
dc.identifier.scopusid2-s2.0-10444234257-
dc.type.rimsART-
dc.citation.volume45-
dc.citation.issue5-
dc.citation.beginningpage1240-
dc.citation.endingpage1243-
dc.citation.publicationnameJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorWoo, Seong-Ihl-
dc.contributor.nonIdAuthorJeon, MK-
dc.contributor.nonIdAuthorKim, YI-
dc.contributor.nonIdAuthorNahm, SH-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorBi4Ti3O12-
dc.subject.keywordAuthorferroclectric-
dc.subject.keywordAuthorstructure analysis-
dc.subject.keywordAuthorX-ray diffraction-
dc.subject.keywordPlusBISMUTH TITANATE-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusMEMORIES-
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