DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jeon, MK | ko |
dc.contributor.author | Woo, Seong-Ihl | ko |
dc.contributor.author | Kim, YI | ko |
dc.contributor.author | Nahm, SH | ko |
dc.date.accessioned | 2010-05-11T01:46:16Z | - |
dc.date.available | 2010-05-11T01:46:16Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-11 | - |
dc.identifier.citation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, no.5, pp.1240 - 1243 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | http://hdl.handle.net/10203/18185 | - |
dc.description.abstract | The structure analysis of Bi4Ti3O12 was performed by using X-ray powder diffraction data to determine a suitable structure system. Two kinds of structural models, monoclinic (M-model) and orthorhombic (O-model), were assumed, and Rietveld refinement was carried out. The weighted and profile R-factors, R-wp and R-p, obtained from the refinement results based on the O-model were 19.54 and 14.84, respectively. On the basis of the M-model, both of the R.-factors, R-wp and Rp, decreased to 14.82 and 10.74, respectively. The goodness-of-fit indicator, S (= R-wp/R.(e)), also decreased from 1.43 to 1.09. The final lattice parameters calculated from the refinement results were a = 5.4496(l) Angstrom, b = 5.4105(l) Angstrom, and c = 32.8136(9) Angstrom. The beta angle was 89.96(3)degrees. | - |
dc.description.sponsorship | This work was partially supported by the Center for Ultramicrochemical Process Systems (CUPS) sponsored by KOSEF (2004) and the Centre for Nanoscale Mechatronics and Manufacturing. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.subject | BISMUTH TITANATE | - |
dc.subject | THIN-FILMS | - |
dc.subject | TEMPERATURE | - |
dc.subject | MEMORIES | - |
dc.title | Structure analysis of ferroelectric Bi4Ti3O12 by using X-ray powder diffraction | - |
dc.type | Article | - |
dc.identifier.wosid | 000225146300010 | - |
dc.identifier.scopusid | 2-s2.0-10444234257 | - |
dc.type.rims | ART | - |
dc.citation.volume | 45 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 1240 | - |
dc.citation.endingpage | 1243 | - |
dc.citation.publicationname | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Woo, Seong-Ihl | - |
dc.contributor.nonIdAuthor | Jeon, MK | - |
dc.contributor.nonIdAuthor | Kim, YI | - |
dc.contributor.nonIdAuthor | Nahm, SH | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | Bi4Ti3O12 | - |
dc.subject.keywordAuthor | ferroclectric | - |
dc.subject.keywordAuthor | structure analysis | - |
dc.subject.keywordAuthor | X-ray diffraction | - |
dc.subject.keywordPlus | BISMUTH TITANATE | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | MEMORIES | - |
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