Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Type Article

Showing results 5250 to 5269 of 7208

5250
Quantitative analysis of magnon characteristics with unidirectional magnetoresistance

Lee, Nyun Jong; Jang, Heechan; Park, Eunkang; Lee, Ki-Seung; Jeong, Seyeop; Lee, Soogil; Park, Byong-Guk; et al, PHYSICAL REVIEW APPLIED, v.20, no.6, 2023-12

5251
Quantitative analysis of repassivation kinetics of ferritic stainless steels based on the high field ion conduction model

Cho, EunAe; Kim, Chin-Kwan; Kim, Joon-Shick; Kwon, Hyuk-Sang, ELECTROCHIMICA ACTA, v.45, no.12, pp.1933 - 1942, 2000-02

5252
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory deviceQuantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

노광수, ISAF, 2000

5253
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

Woo, J; Hong, Daniel Seungbum; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.3, pp.818 - 824, 2001

5254
Quantitative comparison of the influences of tungsten and molybdenum on the passivity of Fe-29Cr ferritic stainless steels

Ahn, MK; Kwon, Hyuk-Sang; Lee, HyuckMo, CORROSION SCIENCE, v.40, no.2-3, pp.307 - 322, 1998-02

5255
Quantitative evaluations of a high-voltage multiscan CCD camera

Kim, YM; Lee, JeongYong; Moonen, D; Jang, KI; Kim, YJ, JOURNAL OF ELECTRON MICROSCOPY, v.56, pp.217 - 224, 2007-12

5256
Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy

Choi, Hyun-Woo; Hong, Daniel Seungbum; No, Kwang-Soo, REVIEW OF SCIENTIFIC INSTRUMENTS, v.82, no.11, 2011-11

5257
Quantitative Measurement of Li-Ion Concentration and Diffusivity in Solid-State Electrolyte

Park, Gun; Kim, Hongjun; Oh, Jimin; Choi, Youngwoo; Ovchinnikova, Olga S.; Min, Seokhwan; Lee, Young-Gi; et al, ACS APPLIED ENERGY MATERIALS, v.4, no.1, pp.784 - 790, 2021-01

5258
Quantitative measurements of absolute dielectrophoretic forces using optical tweezers

Hong, Yoochan; Pyo, Jin-Woo; Baek, Sang Hyun; Lee, Sang Woo; Yoon, Dae Sung; No, Kwangsoo; Kim, Beop-Min, OPTICS LETTERS, v.35, no.14, pp.2493 - 2495, 2010-07

5259
Quantitative morphometric measurements using site selective image cytometry of intact tissue

Kwon, Hyuk-Sang; Nam, YoonSung; Wiktor-Brown, Dominika M.; Engelward, Bevin P.; So, Peter T. C., JOURNAL OF THE ROYAL SOCIETY INTERFACE, v.6, pp.45 - 57, 2009-02

5260
Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy

Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05

5261
Quantitative study on the enhancement of sidewall coverage of sputter-deposited film by partially tapering the sidewall of via holes

Kim, Chang-Gyu; Lee, Won-Jong, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.29, no.2, pp.020604-1 - 020604-6, 2011-03

5262
Quantitatuve analysis of ultrathin SiO2 interfacial layer by AES depth profiling

Soh, Ju-Won; Kim, Jong-Seok; Lee, Won-Jong, KOREAN JOURNAL OF CERAMICS, v.1, no.1, pp.7 - 12, 1995-03

5263
Quantum Dot/Siloxane Composite Film Exceptionally Stable against Oxidation under Heat and Moisture

Kim, Hwea Yoon; Yoon, Daeun; Jang, Junho; Lee, Daewon; Choi, Gwang Mun; Chang, Joon Ha; Lee, Jeong Yong; et al, JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.138, no.50, pp.16478 - 16485, 2016-12

5264
Quartz crystal resonator based scanning probe microscopy

Seo, YH; Hong, SB, MODERN PHYSICS LETTERS B, v.19, no.26, pp.1303 - 1322, 2005-11

5265
Quasi-graphitic carbon shell-induced Cu confinement promotes electrocatalytic CO2 reduction toward C2+ products

Kim, Ji-Yong; Hong, Deokgi; Lee, Jae-Chan; Kim, Hyoung Gyun; Lee, Sungwoo; Shin, Sangyong; Kim, Beomil; et al, NATURE COMMUNICATIONS, v.12, no.1, pp.3765, 2021-06

5266
Quasi-steady-state creep crack growth in a 3.5NiCrMoV steel

Ryu, SH; Yu, Jin; Hong, SH, METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, v.28, no.3, pp.629 - 635, 1997-03

5267
Quaternary Cu2ZnSnS4 nanocrystals: Facile and low cost synthesis by microwave-assisted solution method

Shin, Seung Wook; Han, Jun Hee; Park, Chan Yeong; Moholkar, Annasaheb Vitthal; Lee, JeongYong; Kim, Jin Hyeok, JOURNAL OF ALLOYS AND COMPOUNDS, v.516, pp.96 - 101, 2012-03

5268
QUATERNARY PHASE-RELATIONS NEAR YBA2CU3O6+X AT 850-DEGREES-C IN REDUCED OXYGEN PRESSURES

Ahn, Byung Tae; LEE, VY; BEYERS, R; GUR, TM; HUGGINS, RA, PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, v.167, no.5-6, pp.529 - 537, 1990-05

5269
Quenching-Resistant Solid-State Photoluminescence of Graphene Quantum Dots: Reduction of pi-pi Stacking by Surface Functionalization with POSS, PEG, and HDA

Park, Minsu; Jeong, Yangho; Kim, Hyung Suk; Lee, Woochan; Nam, Sang-Hyeon; Lee, Sukki; Yoon, Hyewon; et al, ADVANCED FUNCTIONAL MATERIALS, v.31, no.29, pp.2102741, 2021-07

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