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Reduction of Leakage Current at the Gate Edge of SDB SO1 NMOS Transistor Kang, Sung-Weon; Lyu, Jong-Son; Kang, Jin-Young; Kang, Sang-Won; Lee, Jin-Hyo, IEEE ELECTRON DEVICE LETTERS, v.16, no.6, pp.236 - 236, 1995-06 |
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