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Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy Lee, Kimoon; Oh, Min Suk; Mun, Sung-jin; Lee, Kwang H.; Ha, Tae Woo; Kim, Jae Hoon; Park, Sang-Hee Ko; et al, ADVANCED MATERIALS, v.22, no.30, pp.3260 - 3260, 2010-08 |
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