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1
Control of wet-etching thickness in the vertical cavity surface emitting laser structure by in situ laser reflectometry

Cho, HK; Lee, JeongYong; Lee, B; Baek, JH; Han, WS, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.17, no.6, pp.2626 - 2629, 1999-11

2
Evolution of the surface cross-hatch pattern in InxGa1-xAs/GaAs layers grown by metal-organic chemical vapor deposition

Yoon, M; Lee, B; Baek, JH; Park, HyoHoon; Lee, EH; Lee, JeongYong, APPLIED PHYSICS LETTERS, v.68, no.1, pp.16 - 18, 1996-01

3
In-situ laser reflectometry method for wet-etch endpoint detection of VCSEL structure

Cho, HK; Lee, JeongYong; Lee, B; Baek, JH; Han, WS, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.1076 - 1079, 1999-12

4
Observation of phase separation and ordering in the InAlAs epilayer grown on InP at the low temperature

Cho, HK; Lee, JeongYong; Kwon, MS; Lee, B; Baek, JH; Han, WS, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, v.64, no.3, pp.174 - 179, 1999-10

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