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Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscope Lim, Do Kyung; Kubo, Osamu; Shingaya, Yoshitaka; Nakayama, Tomonobu; Kim, Young Heon; Lee, JeongYong; Aono, Masakazu; et al, APPLIED PHYSICS LETTERS, v.92, no.20, 2008-05 |
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