Showing results 1 to 2 of 2
Conduction and Low-Frequency Noise Analysis in Al/alpha-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices Lee, Jung-Kyu; Jeong, Hu Young; Cho, In-Tak; Lee, JeongYong; Choi, Sung-Yool; Kwon, Hyuck-In; Lee, Jong-Ho, IEEE ELECTRON DEVICE LETTERS, v.31, no.6, pp.603 - 605, 2010-06 |
The Influence of Hydrogen on Defects of In-Ga-Zn-O Semiconductor Thin-Film Transistors With Atomic-Layer Deposition of Al2O3 Kim, Taeho; Nam, Yunyong; Hur, Jihyun; Park, Sang-Hee Ko; Jeon, Sanghun, IEEE ELECTRON DEVICE LETTERS, v.37, no.9, pp.1131 - 1134, 2016-09 |
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