Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject ferroelectricity

Showing results 1 to 8 of 8

1
$(1-x)Pb(Yb_{1/2}Ta{1/2})O_3$-$xPb(Fe_{1/2}Ta_{1/2})O_3$ 고용계에서의 유전특성 및 상전이 거동 = (The) dielectric properties and phase transition of $(1-x)Pb(Yb_{1/2}Ta{1/2})O_3$-$xPb(Fe_{1/2}Ta_{1/2})O_3$link

윤상철; Youn, Sang-Chul; et al, 한국과학기술원, 2002

2
$BiFeO_3$ 기반 세라믹스에서 미세 구조 및 다강체 특성 분석 = Investigation of Microstructure and Multiferroic Properties in $BiFeO_3$ -based Ceramicslink

전나리; Jeon, Na-Ri; et al, 한국과학기술원, 2011

3
$BiFeO_3$ 기반 세라믹스에서 미세 구조 및 다강체 특성 분석 = Investigation of Microstructure and Multiferroic Properties in $BiFeO_3$ -based Ceramicslink

전나리; Jeon, Na-Ri; et al, 한국과학기술원, 2011

4
Electric characteristics of organic thin-film transistors and logic circuits with a ferroelectric gate insulator

Yang, Yong Suk; Chu, Hye Yong; Kim, Seong Hyun; Lim, Sang Chul; Koo, Jae Bon; Lee, Jung Hun; Ku, Chan Hoe; et al, THIN SOLID FILMS, v.515, no.19, pp.7688 - 7691, 2007-07

5
Low-Temperature Growth of Ferroelectric Hf0.5Zr0.5O2 Thin Films Assisted by Deep Ultraviolet Light Irradiation

Joh, Hyunjin; Anoop, Gopinathan; Lee, Won-June; Das, Dipjyoti; Lee, Jun Young; Kim, Tae Yeon; Kim, Hoon; et al, ACS APPLIED ELECTRONIC MATERIALS, v.3, no.3, pp.1244 - 1251, 2021-03

6
Multi-Step Chemical Solution Deposition-Annealing Process Toward Wake-Up Free Ferroelectricity in Y:HfO2 Films

Samanta, Shibnath; Anoop, Gopinathan; Joh, HyunJin; Seol, WooJun; Park, Seong Min; Unithrattil, Sanjith; Lee, Jun Young; et al, ADVANCED MATERIALS INTERFACES, v.8, no.18, pp.2100907, 2021-09

7
Room-temperature multiferroicity in NiFe2O4 and its magnetoelectric coupling intensified through defect engineering

Cho, Jae-Hyeon; Cho, Seongwoo; Lee, Jun Han; Palneedi, Haribabu; Lee, Ju-Hyeon; Kim, Hwang-Pill; Lee, Nyun Jong; et al, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.104, no.12, pp.6384 - 6392, 2021-12

8
Screening mechanisms at polar oxide heterointerfaces

Hong, Daniel Seungbum; Nakhmanson, Serge M.; Fong, Dillon D., REPORTS ON PROGRESS IN PHYSICS, v.79, no.7, 2016-07

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