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Determination of the diffusivity of cation vacancy in a passive film of Ni using Mott-Schottky analysis and in-situ ellipsometry Jang, HeeJin; Oh, Kkoch Nim; Ahn, SeJin; Kwon, Hyuk-Sang, METALS AND MATERIALS INTERNATIONAL, v.20, no.2, pp.277 - 283, 2014-03 |
Spectroscopic ellipsometry studies on the optical constants of indium tin oxide films deposited under various sputtering conditions Jung, Yeon Sik, THIN SOLID FILMS, v.467, no.1-2, pp.36 - 42, 2004-11 |
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