Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject electrical stability
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| Effects of gate bias stress on the electrical characteristics of ZnO thin film transistor Jeon, Jae-Hong; Choe, Hee-Hwan; Lee, Kang-Woong; Shin, Jae-Heon; Hwang, Chi-Sun; Park, Sang-Hee Ko; Seo, Jong-Hyun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, no.1, pp.412 - 415, 2008-07 |
| Effects of Interfacial Dielectric Layers on the Electrical Performance of Top-Gate In-Ga-Zn-Oxide Thin-Film Transistors Cheong, Woo-Seok; Lee, Jeong-Min; Yoon, Sung Min; Lee, Jong-Ho; Yang, Shinhyuk; Chung, Sung Mook; Cho, Kyoung Ik; et al, ETRI JOURNAL, v.31, no.6, pp.660 - 666, 2009-12 |
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