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Microstructural characterization at the interface of Al2O3/ZnO/Al2O3 thin films grown by atomic layer deposition Jang, Yong-Woon; Bang, Seok-Hwan; Jeon, Hyeong-Tag; Lee, Jeong-Yong, PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, v.248, no.7, pp.1634 - 1638, 2011-07 |
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