Showing results 1 to 4 of 4
Drying temperature effects on microstructure, electrical properties and electro-optic coefficients of sol-gel derived PZT thin films Lee, C; Spirin, V; Song, H; No, Kwangsoo, THIN SOLID FILMS, v.340, no.1, pp.242 - 249, 1999-02 |
Measurement of the differential Pockels and Kerr coefficients of thin films by a two-beam polarization interferometer with a reflection configuration Spirin, VV; Mendieta, FJ; No, Kwangsoo, FERROELECTRICS, v.271, pp.1911 - 1916, 2002 |
Measurement of the Pockels coefficient of lead zirconate titanate thin films by a two-beam polarization interferometer with a reflection configuration Spirin, VV; Lee, C; No, Kwangsoo, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.15, no.7, pp.1940 - 1946, 1998-07 |
Measurement of the quadratic electrooptic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer Spirin, VV; Lee, CH; No, Kwangsoo, OPTICS COMMUNICATIONS, v.158, no.1-6, pp.239 - 249, 1998-12 |
Discover