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Measurement of the differential Pockels and Kerr coefficients of thin films by a two-beam polarization interferometer with a reflection configuration Spirin, VV; Mendieta, FJ; No, Kwangsoo, FERROELECTRICS, v.271, pp.1911 - 1916, 2002 |
Measurement of the Pockels coefficient of lead zirconate titanate thin films by a two-beam polarization interferometer with a reflection configuration Spirin, VV; Lee, C; No, Kwangsoo, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.15, no.7, pp.1940 - 1946, 1998-07 |
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