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Intrinsic stress dependence of c-axis orientation ratio in PbTiO3 thin films deposited by reactive sputtering Kweon, SY; Yi, SH; Choi, Si-Kyung, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.15, no.1, pp.57 - 61, 1997-01 |
Oxidation-induced strain relaxation and related dielectric-temperature behavior in core/shell grained BaTiO3 Jeon, Sang-Chae; Kang, Suk-Joong L., JOURNAL OF ELECTROCERAMICS, v.35, no.1-4, pp.129 - 134, 2015-12 |
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