Showing results 1 to 2 of 2
Extreme-Pressure Imprint Lithography for Heat and Ultraviolet-Free Direct Patterning of Rigid Nanoscale Features Park, Woon Ik; Park, Tae Wan; Choi, Young Joong; Lee, Sangryun; Ryu, Seunghwa; Liang, Xiaogan; Jung, Yeon Sik, ACS NANO, v.15, no.6, pp.10464 - 10471, 2021-06 |
RELATION BETWEEN POISSONS RATIO AND IONICITY IN SIMPLE BINARY CUBIC COMPOUNDS SOH, JW; Lee, HyuckMo; KWON, HS, JOURNAL OF ALLOYS AND COMPOUNDS, v.194, pp.119 - 125, 1993 |
Discover