Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Author Shin, B.
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| Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors Long, R. D.; Shin, B.; Monaghan, S.; Cherkaoui, K.; Cagnon, J.; Stemmer, S.; McIntyre, P. C., JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.158, no.5, pp.103 - 107, 2011 |
| Thermally evaporated Cu2ZnSnS4 solar cells Wang, K.; Gunawan, O.; Todorov, T.; Shin, B.; Chey, S. J.; Bojarczuk, N. A.; Mitzi, D.; et al, APPLIED PHYSICS LETTERS, v.97, no.14, 2010-10 |
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