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Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy Yuk, Jong Min; Jeong, Huyoung; Kim, Nayeon; Lee, Mijin; Lee, Jeong Yong; lee, Zonghoon, MICROSCOPY AND MICROANALYSIS, v.19, no.S2, pp.1226 - 1227, 2013-08 |
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