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Methodology to Analyze Failure Mechanisms on RF-MEMS Switch Using Nano-Indenter kim, Dong Seok; Ko, Seung Deok; Lee, Byung Kee; Yoon, Jun Bo; Kim, Do Kyung, 2010년도 한국재료학회 춘계학술발표대회 및 제18회 신소재 심포지엄 , 한국재료학회, 2010-05-13 |
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