Showing results 1 to 1 of 1
Characterization of basal plane dislocations in PVT-grown SiC by transmission electron microscopy Jeong, Myoungho; Kim, Dong-Yeob; Hong, Soon-Ku; Lee, Jeong Yong; Yeo, Im Gyu; Eun, Tai-Hee; Chun, Myoung-Chuel, KOREAN JOURNAL OF MATERIALS RESEARCH, v.26, no.11, pp.656 - 661, 2016-11 |
Discover