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Microstructural Characterization in Rotated Double-Layer Graphene Using Transmission Electron Microscopy Lee, JeongYong; Yuk, Jong Min; Jeong, HY; Lee, MJ; Kim, NY; Lee, ZH, 2013 Materials Research Society Spring Meeting, Materials Research Society, 2013-04-03 |
Plasma-enhanced atomic layer deposition of tantalum nitrides using hydrogen radicals as a reducing agent Park, JS; Lee, MJ; Lee, CS; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.4, no.4, pp.17 - 19, 2001-04 |
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