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Stability of a-InGaZnO thin film transistor under pulsed gate bias stress Seo, Seung-Bum; Jeon, Jae-Hong; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Sang-Hee Ko, THIN SOLID FILMS, v.521, pp.212 - 215, 2012-10 |
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