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Impact of Sn/Zn ratio on the gate bias and temperature-induced instability of Zn-In-Sn-O thin film transistors Ryu, Min Ki; Yang, Shinhyuk; Park, Sang-Hee Ko; Hwang, Chi-Sun; Jeong, Jae Kyeong, APPLIED PHYSICS LETTERS, v.95, no.17, 2009-10 |
Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscope Lim, Do Kyung; Kubo, Osamu; Shingaya, Yoshitaka; Nakayama, Tomonobu; Kim, Young Heon; Lee, JeongYong; Aono, Masakazu; et al, APPLIED PHYSICS LETTERS, v.92, no.20, 2008-05 |
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