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III-V nMOSFETs - Some issues associated with roadmap worthiness (invited) Thayne, Iain; Bentley, Steven; Holland, Martin; Jansen, Wout; Li, Xu; Macintyre, Douglas; Thoms, Stephen; et al, MICROELECTRONIC ENGINEERING, v.88, no.7, pp.1070 - 1075, 2011-07 |
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