Showing results 3 to 4 of 4
Negative Gate Bias and Light Illumination-Induced Hump in Amorphous InGaZnO Thin Film Transistor Jeon, Jae-Hong; Seo, Seung-Bum; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Kee-Chan; Park, Sang-Hee Ko, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.11, pp.7535 - 7539, 2013-11 |
Stability of a-InGaZnO thin film transistor under pulsed gate bias stress Seo, Seung-Bum; Jeon, Jae-Hong; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Sang-Hee Ko, THIN SOLID FILMS, v.521, pp.212 - 215, 2012-10 |
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