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Electromigration Reliability of Barrierless Ruthenium and Molybdenum for Sub-10 nm Interconnection Kim, Jungkyun; Rhee, Hakseung; Son, Myeong Won; Park, Juseong; Kim, Gwangmin; Song, Hanchan; Kim, Geunwoo; et al, ACS APPLIED ELECTRONIC MATERIALS, v.5, no.5, pp.2447 - 2453, 2023-04 |
Opposite spin asymmetry of elastic and inelastic scattering of nonequilibrium holes injected into a ferromagnet Park, Byong Guk; Banerjee, T; Lodder, JC; Jansen, R, PHYSICAL REVIEW LETTERS, v.97, no.13, 2006-09 |
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