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Mechanism study of reversible resistivity change in oxide thin film Hong, S.; Chang, S. H.; Phatak, C.; Magyari-Kope, B.; Nishi, Y.; Chattopadhyay, S.; Kim, J. H., Symposium on Nonvolatile Memories 4 - 228th ECS Meeting, pp.51 - 55, Electrochemical Society Inc., 2015-10 |
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