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Confined and Chemically Flexible Grain Boundaries in Polycrystalline Compound Semiconductors Abou-Ras, Daniel; Schmidt, Sebastian S.; Caballero, Raquel; Unold, Thomas; Schock, Hans-Werner; Koch, Christoph T.; Schaffer, Bernhard; et al, ADVANCED ENERGY MATERIALS, v.2, no.8, pp.992 - 998, 2012-08 |
Electron holography study for two-dimensional dopant profile measurement with specimens prepared by backside ion milling Yoo, Jung Ho; Yang, Jun-Mo; Ulugbek, Shaislamov; Ahn, Chi Won; Hwang, Wook-Jung; Park, Joong Keun; Park, Chul Min; et al, JOURNAL OF ELECTRON MICROSCOPY, v.57, no.1, pp.13 - 18, 2008-01 |
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