Showing results 1 to 4 of 4
Formation, Characterization and Application of Ferroelectric Domain in Nanometer Scale using Scanning Force Microscopy 노광수; 신현정; 홍승범, 한국요업학회 추계학술대회, 한국요업학회, 2001-01-01 |
Microstructure and properties of Pb(Zr,Ti)O3 (PZT) thin films having different thickness 노광수; 홍종인; 송한욱; 신정규; 신현정, 한국요업학회 춘계학술발표대회, 한국요업학회, 2001-01-01 |
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory device 노광수; 우정원; 홍승범; 신현정; 전종업, 한국요업학회 춘계학술발표대회, 한국요업학회, 2000-01-01 |
The study on the degradation of surface properties of PZT thin films with time 노광수; 송한욱; 홍종인; 신현정; 신정규, 한국재료학회 춘계학술 발표대회, 한국재료학회, 2001 |
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