DC Field | Value | Language |
---|---|---|
dc.contributor.author | Baek, Jong Tae | ko |
dc.contributor.author | Park, Hyung-Ho | ko |
dc.contributor.author | Kang, Sang-Won | ko |
dc.contributor.author | Ahn, Byung Tae | ko |
dc.contributor.author | Yoo, Hyung Joun | ko |
dc.date.accessioned | 2013-08-08T04:10:14Z | - |
dc.date.available | 2013-08-08T04:10:14Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996-11 | - |
dc.identifier.citation | THIN SOLID FILMS, v.288, no.1-2, pp.41 - 44 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | http://hdl.handle.net/10203/174275 | - |
dc.description.abstract | A novel antifuse structure with planar-type polysilicon pad is described. The formation of a link between the aluminum electrodes after application of a programming voltage was also investigated. The structure consists of Al/SiO2/poly-Si/SiO2/Al layers. The poly-Si pac! was doped with boron and the thickness of the antifuse dielectric was 9 nm. When a programming voltage is applied, the electrodes are connected by the mass transfer of aluminum through the dielectric and the doped polysilicon pad. The on-state resistance of about 10 Omega, which is the lowest on-state resistance ever reported, is obtained after breakdown with 9.9 V programming voltage. Scanning Anger microscopy analyses show the propagation of a link, as mass transfer of aluminum in the boron doped polysilicon pad. The elliptical link has a maximum diameter of 1.0 mu m in the horizontal direction and a minimum diameter of 320 nm in the vertical direction. | - |
dc.language | English | - |
dc.publisher | Elsevier BV | - |
dc.subject | METAL | - |
dc.title | Investigation of link formation in a novel planar-type antifuse structure | - |
dc.type | Article | - |
dc.identifier.wosid | A1996VZ20500008 | - |
dc.identifier.scopusid | 2-s2.0-0030288033 | - |
dc.type.rims | ART | - |
dc.citation.volume | 288 | - |
dc.citation.issue | 1-2 | - |
dc.citation.beginningpage | 41 | - |
dc.citation.endingpage | 44 | - |
dc.citation.publicationname | THIN SOLID FILMS | - |
dc.identifier.doi | 10.1016/S0040-6090(96)08812-8 | - |
dc.contributor.localauthor | Kang, Sang-Won | - |
dc.contributor.localauthor | Ahn, Byung Tae | - |
dc.contributor.localauthor | Yoo, Hyung Joun | - |
dc.contributor.nonIdAuthor | Baek, Jong Tae | - |
dc.contributor.nonIdAuthor | Park, Hyung-Ho | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | antifuse structure | - |
dc.subject.keywordAuthor | link formation | - |
dc.subject.keywordPlus | METAL | - |
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